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Found 4 from your keywords: author="Muhida, R."
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Flashover Treeing Of Insulators Under Electron Bombardment
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Haruman, EsaMuhida, R.Sutjipto, A.GE.

This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators by bombarding an insulator surface by an electron beam. A simple model is used to obtain the distribution of electric field on the bombarded surface and explain the occurring of a surface flashover in the form of a treeing. The duration of bombardment needed to initiate a tree…

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The Use of Scanning Electron Microscope in Evaluating Insulation Property
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Haruman, EsaMuhida, R.Sutjipto, A.GE.Sopyan, IAfzeri

This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated-insulator surface at once. The distribution of electric field created by the surface charging can be developed by a simple model. The inc…

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The Effect Of CaO Addition On The Microstructural, Mechanical and Dielectric …
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Haruman, EsaMuhida, R.Sutjipto, A.GE.Sopyan, IMalik, Afzeri, H.

Effect of CaO addition up to 10 wt% on the microstructural, mechanical and dielectric properties of a high purity MgO was studied. The fracture surface of the different addition of CaO was observed and the bending strength and surface breakdown under electron bombardment were determined. The effect of CaO addition was discussed according to the changes in the mi…

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Novel Dielectrics Characterization Using SEM
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Haruman, EsaA.G.E.SutjiptoAzferiMuhida, R.

Materials stress under such irradiation can be found in space craft and industrial electronics. This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated-insulator surface at …

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