Undoped polycrystalline Si (poly-Si) photovoltaic thin films prepared by VHF-PECVD on differently textured substrates have been investigated by a conductive scanning probe microscope (SPM) technique. Influences of the substrate texture on the crystal growth as well as the local current flow are discussed. Keywords: Polycrystalline silicon, thin film, crystal growth, textured su…
Materials stress under such irradiation can be found in space craft and industrial electronics. This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated-insulator surface at …