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Found 2 from your keywords: author=Sopyan, I
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The Use of Scanning Electron Microscope in Evaluating Insulation Property
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Haruman, EsaMuhida, R.Sutjipto, A.GE.Sopyan, IAfzeri

This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated-insulator surface at once. The distribution of electric field created by the surface charging can be developed by a simple model. The inc…

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The Effect Of CaO Addition On The Microstructural, Mechanical and Dielectric …
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Haruman, EsaMuhida, R.Sutjipto, A.GE.Sopyan, IMalik, Afzeri, H.

Effect of CaO addition up to 10 wt% on the microstructural, mechanical and dielectric properties of a high purity MgO was studied. The fracture surface of the different addition of CaO was observed and the bending strength and surface breakdown under electron bombardment were determined. The effect of CaO addition was discussed according to the changes in the mi…

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