The Use of Scanning Electron Microscope in Evaluating Insulation Property

This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated-insulator surface at once. The distribution of electric field created by the surface charging can be developed by a simple model. The inc…