Computer File

Flashover Treeing Of Insulators Under Electron Bombardment

---

This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators by bombarding an insulator surface by an electron beam. A simple model is used to obtain the distribution of electric field on the bombarded surface and explain the occurring of a surface flashover in the form of a treeing. The duration of bombardment needed to initiate a tree information (hereinafter time to flashover treeing/TTF) was used to evaluate the insulation property. Under a certain SEMc energy and magnification, several MgO based insulators exhibited a different TTF. Therefore, this method can be used to evaluate the insulation property especially for insulators that are exposed in electron beam environment.

---

Availability

Detail Information

Series Title

-

Call Number

-

Publisher

Birmingham : Electron Microscopy Society of Malaysia., 2004

Collation

-

Language

English

ISBN/ISSN

-

Classification

-

Content Type

-

Media Type

-

Carrier Type

-

Edition

-

Subject(s)

Electron Bombardment

Specific Detail Info

13th Scientific Conference and 14te Annual General Meeting Electron Microscopy Society of Malaysia, Putra Jaya, 13-15 Dec. 2004

Statement of Responsibility

-

Other version/related

File Attachment

Comments

---

You must be logged in to post a comment